High-quality LuBa2Cu3O7-delta (LBCO) thin films have been grown on [100] LaAlO3 by pulsed laser deposition. Microstructural studies have indicated a high degree of c-axis orientation and an in-plane alignment. Transport measurements carried out on 10 mum wide microbridges of LBCO films have shown high critical current densities in the range 2-5 X 10(6) A cm-2 at 77 K. Self-field induced flux creep caused by transport currents has also been studied. However, the thickness-dependent effective microwave surface resistance, R(eff), measured using a microstrip resonator technique at the X band has shown a minimum at 3000 angstrom indicating film degradation above 3000 angstrom
