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Micro Hall effect metrology
Authors
Peter Bøggild
T. Clarysse
+9 more
Ole Hansen
Henrik Hartmann Henrichsen
Rong Lin
Peter Folmer Nielsen
Dirch Hjorth Petersen
E. Rosseel
W. Vandervorst
Fei Wang
Frederik Westergaard Østerberg
Publication date
1 January 2012
Publisher
Abstract
Abstract is not available.
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Online Research Database In Technology
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Last time updated on 22/08/2013