Glatzel, Thilo

Schimmel, Thomas

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Thilo Glatzel

Thomas Schimmel

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Advanced atomic force microscopy techniques III

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1052Advanced atomic force microscopy techniques IIIThilo Glatzel*1 and Thomas Schimmel2Editorial Open AccessAddress:1Department of Physics, University of Basel, Klingelbergstrasse 82,4056 Basel, Switzerland and 2Institute of Nanotechnology (INT),Karlsruhe Institute of Technology (KIT), 76021 Karlsruhe, GermanyEmail:Thilo Glatzel* - thilo.glatzel@unibas.ch* Corresponding authorKeywords:atomic force microscopyBeilstein J. Nanotechnol. 2016, 7, 1052–1054.doi:10.3762/bjnano.7.98Received: 02 June 2016Accepted: 21 June 2016Published: 21 July 2016This article is part of the Thematic Series "Advanced atomic forcemicroscopy techniques III".Editor-in-Chief: T. Schimmel© 2016 Glatzel and Schimmel; licensee Beilstein-Institut.License and terms: see end of document.Atomic force microscopy (AFM) celebrates its 30th anniver-sary this year. It was presented by Binnig, Quate and Gerber in1986 as an extension of the scanning tunneling microscope(STM) with the possibility to measure forces as small as10−18 N [1]. Since then many different variations of the forcedetection method and various applications have appeared [2,3]and still the scientific community is inventing advanced and im-proved detection mechanisms and fields of operation. The limitsof resolution are not reached yet, however, some researchgroups start characterizing even ”bond-like” features in high-resolution measurements in between atoms of single moleculesor molecular assemblies at positions where chemical bonds areexpected [4-6]. However, the origin of this contrast is underintense discussion [7,8]. The extension of the technique towardsother physical properties in surface science is pushed continu-ously. Combined AFM and STM measurements reveal relatedforce and electronic properties [9], energy dissipation in manip-ulation processes can be examined via the excitation voltageneeded to keep a constant amplitude of the probe oscillation[10,11], pulling forces of atomic or molecular wires can be de-termined and compared with theoretical predictions [12,13], andlocal charges within single molecules can be measured [14,15],however, the quantification is still under intense discussion.Chemical reactions are triggered and imaged by the AFM tip[16,17] and of course the technique is not limited to ultrahigh-vacuum (UHV) and low-temperature conditions. Therefore, thetraditional field in surface science based on diffraction and scat-tering of charged particles, mostly electrons, which are used asprobes in a variety of experimental methods is extended by apowerful local and real space imaging and characterizationtechnique.This third Thematic Series of „advanced atomic force microsco-py techniques“ assembles 22 exciting articles around theimprovement and application of this technique which appearedin the Beilstein Journal of Nanotechnology within the past1.5 years. The articles can roughly be grouped in two majorcategories: local measurements of mechanical properties andhigh resolution force measurements and spectroscopy.The characterization of mechanical properties by AFM mani-fests themselve primarily in the local detection of adhesion,friction and elasticity. Georg Fantner and his co-workers de-veloped an advanced microscope capable of obtaining nano-scale topography as well as mechanical properties by multifre-quency AFM at high speed. They combined recent progress inBeilstein J. Nanotechnol. 2016, 7, 1052–1054.1053increased imaging speed and photothermal actuation in a uniqueand versatile AFM head using ultrasmall cantilevers [18].Single-cell force spectroscopy is used by a biophysics grouparound Jonne Helenius to quantify the contribution of celladhesion to specific substrates at both the cell and single mole-cule level [19]. Furthermore, physico-mechanical properties ofintestinal cells were elucidated by force curve measurements byEva Roblegg and co-workers [20]. The local elastic stiffnessand damping of individual phases in a titanium alloys wasmeasured by using atomic force acoustic microscopy (AFAM)and mapping of contact-resonance spectra [21]. Another alloy,namely a Pt containing metallic glass, was characterized byAFM indentation in UHV to quantitatively determine the hard-ness and deformation mechanisms by Arnaud Caron and RolandBennewitz [22]. Santiago Solares and Enrique A. López-Guerrapresented different approaches to model such viscoelastic prop-erties within AFM simulations [23]. Sliding contact propertieslike several transitions in the friction coefficient with increas-ing load have been found on Au(111) in sulfuric acid elec-trolyte containing Cu ions by Helmut Baltruschat an co-workers[24] and the stiffness of micron-sized sphere-plate contacts wasstudied by Diethelm Johannsmann et al. by employing high fre-quency tangential excitation [25].On the other hand, force spectroscopy and advanced imagingand analysis techniques form a major part of this ThematicSeries. For all AFM experiments the tip condition is one of themost critical parameters, Fei Long et al. presented a method forsingle-molecule probe modification by using a Cu-catalyzedalkyne–azide cycloaddition reaction [26]. To quantify the per-formed measurements in a reproducible way is still a chal-lenging topic in all AFM measurements. In amplitude modula-tion AFM higher harmonic signals can be used, Kfir Kuchukand Uri Sivan presented a mathematical model to derive anaccurate and explicit formulae for both conservative and dissi-pative forces in terms of an arbitrary single harmonic [27],while Luca Costa and Mario S. Rodrigues derived formulas forthe tip–sample interactions and investigated the effect ofspurious resonances on the measured interaction in liquid media[28]. A software package, dForce, was also presented thatallows for a better understanding of amplitude modulation andbimodal AFM experiments in air or liquid [29]. A method forthe calibration of the torsional force by using human fibronectinand its monoclonal antibody was presented by Andrzej J. Kulikand co-workers [30]. High-resolution measurements of theadhesion effect of a water film on CaF2 [31], electric and trans-port phenomena determined by liquid KPFM in ionically-activeand -inactive liquids [32], the spray deposition of single mole-cules to insulating and ionic surfaces [33], and combined STMand AFM measurements on single-layer graphene on SiC(0001)[34] have been investigated, discussed, and presented. Anothercombined STM-AFM study determines very accurately theprobe-nanocrystal interaction potential [35]. Finally, enhancedinformation can also be achieved by more accuratly adjust theused parameters and intensivly analyse the results [36-38].As detailed above this Thematic Series “Advanced atomic forcemicroscopy techniques III” sums up fundamental and appliedprogresses in surfaces science with a clear focus on advancedatomic force microscopy. It continues the Thematic Series “Ad-vanced atomic force microscopy techniques I and II” [39,40].The articles demonstrate again, that despite the already 30thanniversary of AFM, current developments in this research fieldare impressive and by far not finished and we hope to stimulatealso further research groups to take part and apply these suc-cessful techniques to many other exciting surfaces, systems andmaterials.Finally, we want to thank all authors for contributing theirexcellent work to this series and especially the referees for theircontinuous support by providing sound and objective reports.Here, we also want to acknowledge the more and more impor-tant Open Access policy of the Beilstein Journal of Nanotech-nology providing the possibility to continue this exciting andstimulating Thematic Series freely accessible worldwide. More-over, we would like to thank the editing team of the Beilstein-Institut for the excellent and professional framework andsupport allowing for the collection, review, publishing, and dis-tribution of research results in an easy and excellent way.Thilo Glatzel and Thomas SchimmelBasel and Karlsruhe, June 2016References1. Binnig, G.; Quate, C. F.; Gerber, C. Phys. Rev. Lett. 1986, 56, 930.doi:10.1103/PhysRevLett.56.9302. Morita, S.; Giessibl, F. J.; Meyer, E.; Wiesendanger, R., Eds.Noncontact Atomic Force Microscopy; Springer InternationalPublishing, 2015; Vol. 3.3. Sadewasser, S.; Glatzel, T., Eds. Kelvin Probe Force MicroscopyMeasuring and Compensating Electrostatic Forces; Springer Series inSurface Sciences, Vol. 48; Springer-Verlag: Berlin, Heidelberg, 2011.4. Kawai, S.; Sadeghi, A.; Xu, F.; Peng, L.; Orita, A.; Otera, J.;Goedecker, S.; Meyer, E. ACS Nano 2015, 9, 2574–2583.doi:10.1021/nn505876n5. Zhang, J.; Chen, P.; Yuan, B.; Ji, W.; Cheng, Z.; Qiu, X. 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