We report on a newly developed and integrated microscopy and nanoscopy station at the ANKA-IR2 beamline. We further elucidate how vibrational near-field and microspectroscopy can give new insights in medical applications

Brundermann, E.

Edengeiser, E.

Gasharova, B.

Havenith, M.

Mathis, Y.-L.

Mischo, M.

Moss, D.

Schmidt, D. A.

Steinmann, J.

E. Brundermann

D. A. Schmidt

B. Gasharova

Y.-L. Mathis

D. Moss

J. Steinmann

E. Edengeiser

M. Mischo

M. Havenith

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The ANKA-IR2 nanoscope and micro- and nanospectroscopy applications

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Abstract—We report on a newly developed and integrated microscopy and nanoscopy station at the ANKA-IR2 beamline. We further elucidate how vibrational near-field and micro-spectroscopy can give new insights in medical applications. I. INTRODUCTION AND BACKGROUND novel microscopy and nanoscopy station integrated at the ANKA-IR2 synchrotron beamline1 (Fig. 1) combines far- and near-field spectroscopy and microscopy1,2 with a variety of other modalities such as: Raman confocal and atomic force microscopy (AFM)1-3,5, near-field aperture (a-SNOM)1 and aperture-less or scattering near-field optical microscopy (s-SNOM) 1-3,6 in the IR and THz region7.  IR/THz beam extractionand transportFast FeedbackSystem storageringNano-SpectroscopyMicro-Spectroscopy bendingmagnetwindowchangerFTIRe-beamNanoscope  Fig. 1: Nano- and micro-spectroscopy stations at the ANKA-IR2 beamline (photo: view at the multi-modal microscope). They are connected via a versatile window changer and fast feedback system for the optical beam.   The multi-modal nanoscope is designed to combine a broad array of techniques to study the “same” sample at the “same“ position3,5, e.g. semiconductors3 or graphene5, using IR3 and THz synchrotron radiation4. II. RESULTS We report on near-field microscopy applications in the infrared and on the development of time-resolved detection techniques in the THz spectral range. Figure 2 shows a measurement of scattered infrared light from a sample illuminated by one of the additional offline laser sources. The optical beam was passed through the FTIR and focused on the AFM cantilever tip, which oscillates at a sub-MHz frequency f. The scattered light was detected with an IR detector and demodulated with a lock-in amplifier at 2f, a typical operating mode to record near-field images.  012850 900 950 1000 1050 1100Frequency / cm-1Intensity/ arb. units  Fig. 2: FTIR measurement of scattered light from a sample illuminated at 975 cm-1 (29 THz) and demodulated at 2f of the cantilever oscillation frequency f.  We further elucidate how vibrational micro-spectroscopy can give new insights in chemistry and medicine2,6. Introducing infrared active labels6 into super-resolution IR s-SNOM may enable molecular tracking and distribution studies even in complex biological systems6. III. ACKNOWLEDGMENTS The project is supported by BMBF under grants 05KS7PC2 and 05K10PCA. The authors appreciate the beam time made available at ANKA (Karlsruhe, Germany) and thank for the support by the ANKA team.   REFERENCES [1] D.A. Schmidt, E. Bründermann, M. Havenith, “Combined far-and near-field chemical nanoscope at ANKA-IR2: applications and detection schemes”, J. Phys.: Conf. Series 359, pp. 012015-1–012015-8, 2012. [2] D. A. Schmidt, I. Kopf, E. Bründermann, “A matter of scale: from far-field microscopy to near-field nanoscopy”, Laser & Photonics Reviews 6(3), pp. 296–332, 2012. [3] F. Ballout, J.-S. Samson, D.A. Schmidt, E. Bründermann, Y.-L. Mathis, B. Gasharova, A. D. Wieck, M. Havenith, “Non-Invasive Nano-Imaging of Ion Implanted and Activated Copper in Silicon”, J. Appl. Phys. 110(2), pp. 024307-1–024307-7, 2011. E. Bründermanna, D. A. Schmidtb, B. Gasharovac, Y.-L. Mathisd, D. Mossd, J. Steinmanne, E. Edengeisera, M. Mischoa, and M. Havenitha  aPhysikalische Chemie II, Ruhr-Universität Bochum, NC-Nord 7/72, 44780 Bochum, Germany bNorth Carolina A&T State university, Dept. of Physics, Greensboro, NC 27411 and Joint School of Nanoscience & Nanoengineering (A&T & UNCG), Greensboro, NC 27401, USA cKarlsruhe Institute of Technology, Institute for Photon Science and Synchrotron Radiation (IPS), P.O. Box 3640, 76021 Karlsruhe, Germany dKarlsruhe Institute of Technology, ANKA Synchrotron Radiation Facility, P.O. Box 3640, 76021 Karlsruhe, Germany eKarlsruhe Institute of Technology, Laboratory for Applications of Synchrotron radiation (LAS), P.O. Box 3640, 76021 Karlsruhe, Germany The ANKA-IR2 Nanoscope and Micro- and Nanospectroscopy Applications A978-1-4673-4717-4/13/$31.00 ©2013 IEEE[4] A.-S. Müller, N. Hiller, A. Hofmann, E. Huttel, , K. Il'in, V. Judin, B. Kehrer, M. Klein, S. Marsching, C. Meuter, S. Naknaimueang, M.J. Nasse, A. Plech, P. Probst, A. Scheuring, M. Schuh, M. Schwarz, M. Siegel, N. Smale, M. Streichert, F. Caspers, A. Semenov, H.-W. Hübers, E. Bründermann, “Experimental Aspects of CSR in the ANKA Storage Ring”, ICFA Beam Dyn. Newslett., vol. 57, pp. 154-165, 2012. [5] D. A. Schmidt, T. Ohta, T. E. Beechem,  “Strain and charge carrier coupling in epitaxial graphene”, Phys. Rev. B 84 (23), 235422-1 – 235422-8 , 2011. [6] I. Kopf, H.W.P. N'Dongo, F. Ballout, U. Schatzschneider, E. Bründermann, M. Havenith, “Introducing cymantrene labels into scattering scanning near-field infrared microscopy”, Analyst 137, pp. 4995–5001, 2012. [7] E. Bründermann, H-W.Hübers, M.F. Kimmitt, Terahertz Techniques, in Springer Series in Optical Sciences, Berlin, Heidelberg, Springer-Verlag, vol. 151, 2012, pp. 1-383. 

The ANKA-IR2 Nanoscope and Micro- and Nanospectroscopy Applications

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The ANKA-IR2 Nanoscope and Micro- and Nanospectroscopy Applications

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