Method for increasing sensitivity of shear-force distance control for scanning near-field microscopy

Abstract

Scanning-near field optical microscopy requires a distance control mechanism. In most cases, it is based on the shear-force detection. In this paper we report how the performance of the shear-force detection based on the most common nonoptical approach, a Quartz tuning fork, can be improved. Our approach is based on exciting oscillations in just one arm of the fork, not two. This approach reduces the response time of the shear-force detection system. We also introduce an ultra-sensitive system with a long free fiber tip. © 1999 Elsevier Science B.V. All rights reserved