On a Method for Assessing the Electrical State of Gate Oxides in Trench-Gated IGBTs

Authors
Publication date
1 January 2010
Publisher
HAL CCSD

Abstract

International audienc

    Similar works

    Full text

    thumbnail-image

    Available Versions

    Archive Ouverte en Sciences de l'Information et de la Communication

    redirect
    oaioai:HAL:hal-01877183v1
    Last time updated on 18/04/2019