Hoefnagels, JPM Johan

Vermeij, T

Vermeij, Tijmen

Hoefnagels, J.P.M.

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 Can we use electrons to measure local stresses inpolycrystalline materials?Citation for published version (APA):Vermeij, T., & Hoefnagels, J. P. M. (2018). Can we use electrons to measure local stresses in polycrystallinematerials?. Poster session presented at Mate Poster Award 2018.Document status and date:Published: 13/12/2018Document Version:Publisher’s PDF, also known as Version of Record (includes final page, issue and volume numbers)Please check the document version of this publication:• A submitted manuscript is the version of the article upon submission and before peer-review. There can beimportant differences between the submitted version and the official published version of record. Peopleinterested in the research are advised to contact the author for the final version of the publication, or visit theDOI to the publisher's website.• The final author version and the galley proof are versions of the publication after peer review.• The final published version features the final layout of the paper including the volume, issue and pagenumbers.Link to publicationGeneral rightsCopyright and moral rights for the publications made accessible in the public portal are retained by the authors and/or other copyright ownersand it is a condition of accessing publications that users recognise and abide by the legal requirements associated with these rights.            • Users may download and print one copy of any publication from the public portal for the purpose of private study or research.            • You may not further distribute the material or use it for any profit-making activity or commercial gain            • You may freely distribute the URL identifying the publication in the public portal.If the publication is distributed under the terms of Article 25fa of the Dutch Copyright Act, indicated by the “Taverne” license above, pleasefollow below link for the End User Agreement:www.tue.nl/taverneTake down policyIf you believe that this document breaches copyright please contact us at:openaccess@tue.nlproviding details and we will investigate your claim.Download date: 08. Jul. 2024METHODOLOGYDirect IDIC identification of local absolute stress components by [1-2]:• Simultaneous correlation of multiple regions (ROIs) between multiple EBSD patterns• Accounting for plane stress conditions and crystal symmetry• Concurrent IDIC identification of crystal orientation and experimental geometryCan we use electrons to measure local stressesin polycrystalline materials?DEPARTMENT OF MECHANICAL ENGINEERINGPROBLEM STATEMENTMetal structures and components can have localresidual stresses due to processing or deformation. Can we measure these?General goal:• Measure intergranular absolute stress on themicro-scaleAvailable tools:• Electron Backscatter Diffraction (EBSD) in theScanning Electron Microscope (SEM)• Integrated Digital Image Correlation (IDIC)Approach:• Perform IDIC directly on EBSD patterns• Validation on simulated EBSPsTijmen Vermeij* & Johan Hoefnagels*t.vermeij@tue.nl[1] Vermeij & Hoefnagels, Ultramicroscopy 191 (2018) 44-50[2] Vermeij, De Graef, Hoefnagels, Scripta Materialia 162 (2019) 266-271 Formed automobile components[Ramlab][National Material Company]3D-printed shippropellorThermal gradientsExamplesPlastic deformationResidual stressesEBSD (crystal orientation) map of a 3D printed stainless steelSampleElectronColumnEBSD pattern acquisitionEBSD map of an advanced dual-phase steelEBSD image residual examples%Initial guessConvergence11 112323IDIC Correlation of 24 ROIsRESULTS• Rapid convergence with errors in stress below 20MPa• Absolute crystal orientation errors below 0.005°• Projection parameters (geometry) errors below 0.01 pixelCONCLUSIONS• A novel framework is presented, showing high robustness and accuracy• Warranting experimental validation, absolute stresses can potentially be measured inside a Scanning Electron Microscope

Can we use electrons to measure local stresses in polycrystalline materials?

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