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Low-temperature electrical-transport properties of single-crystal bismuth films under pressure
Authors
A. van Hulst
B. A. Tavger
+43 more
C. A. Hoffmann
D. Balla
D. L. Partin
D. L. Partin
E. F. Schubert
E. S. Itskevich
G. E. Smith
G. E. Smith
H. M. Jaeger
H. T. Chu
H. T. Chu
H. T. Chu
H. T. Chu
H. T. Chu
H. T. Chu
H. T. Chu
I. Goldfarb
J. A. van Hulst
L. J. van der Pauw
L. M. Roth
M. A. Reed
M. I. Kaganov
M. J. Kane
Mei Lu
N. B. Brandt
N. Garcia
N. O. Birge
P. W. Bridgman
R. Hartman
R. J. Zieve
R. M. Overney
R. N. Zitter
S. Radelaar
T. F. Rosenbaum
T. F. Smith
T. Zakrzenski
V. B. Sandormirskii
V. N. Lutskii
V. N. Lutskii
Y. Liu
Yu. F. Komnik
Yu. F. Komnik
Yu. F. Ogrin
Publication date
Publisher
'American Physical Society (APS)'
Doi
Abstract
Abstract is not available.
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info:doi/10.1103%2Fphysrevb.53...
Last time updated on 01/04/2019