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AFM tip characterization by Kelvin probe force microscopy
Authors
A S Foster
Barth C
+15Â more
C Barth
C R Henry
F Esch
Girard P
Glatzel T
Jackson J D
Kantorovich L N
Kelvin L
Loppacher C
M Bieletzki
Morita S
Schroder D K
T Hynninen
U Heiz
Zerweck U
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'IOP Publishing'
Doi
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info:doi/10.1088%2F1367-2630%2...
Last time updated on 01/04/2019