Cubic silicon carbide (3C-SiC) with the energy band gap 2.36 eV
(T=300K) possess relatively high electron mobility and appears as promising
material for applications in high power and temperature electronics and devices
for harsh environment. We review optical techniques able to investigate
the optical and photoelectrical properties of SiC at high injection levels. The
excess carriers were injected by a short laser pulse and monitored by timeresolved
free-carrier absorption (FCA) and light-induced transient grating
(LITG) techniques. We also investigated spectra of room-temperature photoluminecense
(RTPL), as a complementary technique to reveal defect-related
properties. We note that latter technique up to now was mainly used to study
low-temperature photoluminescence spectra of SiC