Topologically close packed phases, among them the μ-phase studied here,
are commonly considered as being hard and brittle due to their close packed and
complex structure. Nanoindentation enables plastic deformation and therefore
investigation of the structure of mobile defects in the μ-phase, which, in
contrast to grown-in defects, has not been examined yet. High resolution
transmission electron microscopy (HR-TEM) performed on samples deformed by
nanoindentation revealed stacking faults which are likely induced by plastic
deformation. These defects were compared to theoretically possible stacking
faults within the μ-phase building blocks, and in particular Laves phase
layers. The experimentally observed stacking faults were found resulting from
synchroshear assumed to be associated with deformation in the Laves-phase
building blocks