We present results on growth of large area epitaxial ReS2 thin film both on c
plane sapphire substrate and MoS2 template by pulsed laser deposition (PLD).
Films tend to grow with (0001) ReS2 perpendicular to (0001) Al2O3 and (0001)
ReS2 perpendicular to (0001) MoS2 parallel to (0001) Al2O3 at deposition
temperature below 300 deg C. Films are polycrystalline grown at temperature
above 300 deg C. The smoothness and quality of the films are significantly
improved when grown on MoS2 template compared to sapphire substrate. The
results show that PLD is suitable to grow ReS2 epitaxial thin film over large
area for practical device application