We report the epitaxial growth and the electrical properties, especially the
metal-to-insulator transition (MIT), of vanadium dioxide (VO2) thin films
synthesized on LSAT (111) ([LaAlO3]0.3[Sr2AlTaO6]0.7) substrates by pulsed
laser deposition. X-ray diffraction studies show that the epitaxial
relationship between the VO2 thin films and LSAT substrate is given as
VO2(020)||LSAT(111) and VO2[001]||LSAT[11-2]. We observed a sharp four orders
of magnitude change in the longitudinal resistance for the VO2 thin films
around the transition temperature. We also measured distinct Raman spectra
below and above the transition point indicating a concomitant structural
transition between the insulator and metallic phases, in agreement with past
investigations.Comment: 14 pages, 4 figures, 1 tabl