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Measurement of the CKM Matrix Element Vcb|V_{cb}| from B0D+νB^{0} \to D^{*-} \ell^+ \nu_\ell at Belle

Abstract

We present a new measurement of the CKM matrix element Vcb|V_{cb}| from B0D+νB^{0} \to D^{*-} \ell^+ \nu_\ell decays, reconstructed with the full Belle data set of 711fb1711 \, \rm fb^{-1} integrated luminosity. Two form factor parameterizations, originally conceived by the Caprini-Lellouch-Neubert (CLN) and the Boyd, Grinstein and Lebed (BGL) groups, are used to extract the product F(1)ηEWVcb\mathcal{F}(1)\eta_{\rm EW}|V_{cb}| and the decay form factors, where F(1)\mathcal{F}(1) is the normalization factor and ηEW\eta_{\rm EW} is a small electroweak correction. In the CLN parameterization we find F(1)ηEWVcb=(35.06±0.15±0.56)×103\mathcal{F}(1)\eta_{\rm EW}|V_{cb}| = (35.06 \pm 0.15 \pm 0.56) \times 10^{-3}, ρ2=1.106±0.031±0.007\rho^{2}=1.106 \pm 0.031 \pm 0.007, R1(1)=1.229±0.028±0.009R_{1}(1)=1.229 \pm 0.028 \pm 0.009, R2(1)=0.852±0.021±0.006R_{2}(1)=0.852 \pm 0.021 \pm 0.006. For the BGL parameterization we obtain F(1)ηEWVcb=(34.93±0.23±0.59)×103\mathcal{F}(1)\eta_{\rm EW}|V_{cb}|= (34.93 \pm 0.23 \pm 0.59)\times 10^{-3}, which is consistent with the World Average when correcting for F(1)ηEW\mathcal{F}(1)\eta_{\rm EW}. The branching fraction of B0D+νB^{0} \to D^{*-} \ell^+ \nu_\ell is measured to be B(B0D+ν)=(4.90±0.02±0.16)%\mathcal{B}(B^{0}\rightarrow D^{*-}\ell^{+}\nu_{\ell}) = (4.90 \pm 0.02 \pm 0.16)\%. We also present a new test of lepton flavor universality violation in semileptonic BB decays, B(B0De+ν)B(B0Dμ+ν)=1.01±0.01±0.03 \frac{{\cal B }(B^0 \to D^{*-} e^+ \nu)}{{\cal B }(B^0 \to D^{*-} \mu^+ \nu)} = 1.01 \pm 0.01 \pm 0.03~. The errors correspond to the statistical and systematic uncertainties respectively. This is the most precise measurement of F(1)ηEWVcb\mathcal{F}(1)\eta_{\rm EW}|V_{cb}| and form factors to date and the first experimental study of the BGL form factor parameterization in an experimental measurement

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