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高温处理对ZnO薄膜及其忆阻性能的影响
Authors
张洪亮
施思齐
+5 more
曹鸿涛
梁凌燕
胡令祥
诸葛飞
高俊华
Publication date
1 January 2018
Publisher
Abstract
本文研究了高温处理对ZnO薄膜及其忆阻效应的影响,发现利用经800℃高温处理后的ZnO薄膜制备的Cu/ZnO/Pt器件依然保持忆阻性能,并观察到无电形成过程的忆阻效应。研究表明,无电形成过程的原因在于高温处理后的ZnO薄膜出现了纳米级通道,使得在沉积顶电极Cu的过程中,形成天然的导电通道,使器件呈现低阻态
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Last time updated on 07/01/2019