Evolution of crystallographic texture during deformation of submicron grain size titanium

Abstract

Evolution of deformation texture in commercially pure titanium with submicron grain size (SMG) was studied using x-ray diffraction (XRD) and electron back scatter diffraction (EBSD) methods. The material was deformed by rolling at room temperature. The deformation mechanism was found to be slip dominated with a pyramidal <c + a> slip system facilitating plastic deformation. No evidence of tensile or compressive twinning was detected, as generally seen in the case of titanium with conventional microcrystalline grain size. The absence of twinning and the propensity of the pyramidal <c + a> slip system in the SMG Ti is attributed to the lack of coordinated motion of zonal partial dislocations that leads to twinning