Due to the mechanics of the Atomic Force Microscope (AFM),
there is a curvature distortion (bowing effect) present in the acquired images. At present, flattening such images requires human intervention to manually segment object data from the background, which is time consuming and highly inaccurate. In this paper, an automated algorithm to flatten lines from AFM images is presented. The proposed method classifies the data into objects and background, and fits convex lines in an iterative fashion. Results on real images from DNA wrapped carbon nanotubes (DNACNTs) and synthetic experiments are presented, demonstrating the
effectiveness of the proposed algorithm in increasing the resolution of the surface topography. In addition a link between the flattening problem and MRI inhomogeneity (shading) is given and the proposed method is compared to an entropy based MRI inhomogeniety correction method
