The purpose of this report is to document the results of special tests performed by Bendix Aerospace Division on randomly selected samples of Fairchild integrated operational amplifier circuits to determine if damage can occur to these products due to over-voltage conditions like those experienced by the ALSEP Flight 2 equipments.prepared by K. D. Andreasen

Andreasen, K. D.

USRA Houston Repository

NO. REV. MO. 
: : I • Q~~ ATM 801 
. . ' 
PAGE 1 OF 
Aerospace 
Systems Division 
Reliability Overvoltage Tests ~Fairchild 
Integrated Operational Amplifier Circuits 
DATE 10/10/68 
The purpose of this report is to document the results of special tests 
performed by Bendix Aerospace Division on randomly selected samples of 
Fairchild ~A702 and f'A709 integrated operational amplifier circuits to deter-
mine if damage can occur to these products due to over-voltage conditions like 
those experienced by the ALSEP Flight 2 equipments. 
Six(6) devices of each type were electrically tested initially and after 
being exposed to over-voltage conditions which duplicate and exceed the con-
ditions experienced by the Flight 2 equipment. 
No degradation in either device type was experienced even after higher 
over -voltage values and longer time durations than those of Flight 2 conditions 
were applied. It is concluded that the f1-A702 and ;tA709 products in the Flight 
2 experiments remain flight worthy due to the tolerance of the devices to voltage 
stress conditions as demonstrated herein. 
This investigation was performed to ascertain the flight worthiness of 
f'A702 (SL7274) and;UA709 (SL7275) products now in the Flight 2 Command 
Decoder (S/N 5) and Power Distribution Unit (S/N 7). 
Prepared by: ~t:t::.JZ...._..., 
. D. Andreasen 
Reviewed by: 
Approved by: £c.~b-J 
S. J. Ellison p 
9 
: :. I ~ 
Reliability Overvoltage Tests of Fairchild 
Integrated Operational Amplifier Circuits 
CONTENTS 
1. 0 Objective 
2. 0 Summary of Results and Conclusions 
2. 1 Results 
2. 2 Conclusions 
2. 3 Recommendations 
3. 0 Detailed Test Description 
4. 0 Analysis of Results 
NO. REV. NO. 
ATM 801 
PAGE 2 OF 9 
DATE 10/10/68 
NO. REV. NO. 
: ; I ~ ATM 801 
PAGE 3 OF 9 
Aerospace 
Systems Division 
Reliability Overvoltage Tests of Fairchild 
Integrated Operational Amplifier Circuits 
DATE 10/10/68 
1. 0 Objective 
The investigation of Fairchild linear integrated circuit devices 
~A702 (SL7274) and j'A709 (SL7275) was undertaken to determine if spe-
cific over-voltage conditions could result in damage or performance 
changes. 
The over-voltage values represent the same conditions previous-
ly reported in ATM- 800 and experienced by devices in the Command Dec order 
(S/N), PDU (S/N 7) of Flight 2 equipment during Central Station Power Dis-
sipation Test. Longer application durations and higher voltage conditions 
were also evaluated to determine if a destruction threshold was approached. 
2. 0 Summary of Results and Conclusions 
2. 1 Results 
Six(6) random samples of each device type were withdrawn from 
bonded stores for this investigation. 
Four(4) special test fixtures were fabricated to provide the capa-
bility of displaying the Transfer Function Cnaracteristics and Common 
Mode Input Offset Voltage Characteristics for the two device types. A 
polariod camera was used to record the displays for each individual de-
vice. Mr. Fred Brown of Fairchild informed that these two characteristics 
would indicate if degradation had occurred. 
The devices were exposed to the following conditions; 
j-fA702- -------- -*V + = +19. 5Vdc} 8 minutes 
*V- = -9. 75Vdc 
V+ = +20. 5Vdc } 4 minutes 
V- = -10. 75Vdc 
JAA709-------- --*V + = +19. 5Vdc ) 8 minutes 
*V- = -20. OVdc 
V+ = +20. 5Vdc } 4 minutes 
V- = -21. OVdc 
*The voltages experienced by the Flight 2 equipments for a duration of 
one( 1) minute. 
NO. REV. NO. 
: : . ~ ATM 801 
PAGE 4 Of 9 
Aerospace 
Systems Division 
Reliability Overvoltage Tests of Fairchild 
Integrated Operational Amplifier Circuits 
DATE 10/10/68 
Mr. Brown had indicated that the Fairchild Reliability Specialists 
did not expect that degradation should occur. Bendix overload evaluation 
tests confirmed the ~air child predictions. 
No performance changes of either device type were noted in either 
of the two overload test conditions after the full twelve(l2) minute exposure. 
2. 2 Conclusions 
It is concluded that no degradation would occur due to the over-
voltage condition experienced by the Flight 2 equipments and that this 
investigation has demonstrated that the JAA702 and fA709 products in that 
equipment remain flight worthy. 
The Flight 2 equipment utilizing the f<A702 and fA709 products 
has shown no change in performance due to the brief over-voltage exposure 
which supports the conclusion that no degradation has occurred. 
2. 3 Recommendations 
Continue the use of existing j-«A702 ~nd fA709 products in the 
Flight 2 equipments. 
3. 0 Detailed Test Description 
During the planning of the special overload tests, Mr. Fred Brown 
of Fairchild was contacted and he indicated that degradation resulting from 
over -voltage would cause noticeable changes in amplifier gain and input 
offset voltage values. 
Test fixtures were fabricated using the test circuit information 
obtained from Fairchild. Schematics of these circuits are shown in Fig-
ures 1, 2, 3 and 4. The circuits allowed for the display of the entire Trans-
fer Function and the entire Common Mode Input Offset Voltage Character-
istic for the maximum input voltage condition. Following are typical traces 
recorded using the mentioned circuits. 
NO. REV. NO. 
ATM 801 
Aa-aapace 
Systems Division 
Reliability Overvoltage Tests of Fairchi1d 
Integrated Operational' Amplifier Circuits PAGE 5 Of 
DATE 10/10/68 
TYPICAL TRACES RECORDED 
-:> 
! fl. 0 
;!:l t . 5 
~ 0 
~- .5 
co 
""' 0 -I. 0 
-1-' -I. 5 
::l 
Cl. 
s:: 
1-1 
Common Mode 
( Input Offset Voltage 
)J.f\.109 
V s = .±.IIKcic~ 
-
~n = IOK..Il 
-::::: - .--
-
_... 
--
-
~-~n = '0..(1-
'~-'8 _..:. 6. 4 4 - 2 0 2 4 6 8 
Input Voltage (V) 
t_A702 
V+ = +12Vdc 
-:> +I. e 
- + 
. 
;!:l 
0 
:> 
.... 
Q) 
-1. co 
""' 
""' 0 
~ 
Cl. 
s:: 
1-1 
V- •- -6Vdc 
0 
5 
R·n = 2K.JL 
~ 
-
~ 
l7 
t--
5 
0 Rtn • 5(~ 
- 5 - 4 -3 - 2 -1 0 + 1 
Input Voltage (V) 
Transfer Function 
t2 
tl 
0 f'A709 
5 V s • ±. 18Vdc II= v > fl 
Q) + bO 
ro 
-1-' -
....... 
0 
> -
~ -1 
0.. 
~ -1 
0 
-2 
+6 
+4 
- -t2 
> 0 
Q) 
-2 bO 
ro 
-1-' 
-4 ....... 0 
:> 
-6 
~ 
0.. 
-8 ~ 
0 
0 
5 v 
n v 
5 v 
R1 • 2K.t. ,/ 0 / 
5 %_, = IOKA 
0 
-.5-.4-.3-,2-.1 0. 1.2. 3. 4. 5 
Input Voltage (m V) 
f<A702 
Vt = tl2Vdc 
V- = -6Vdc 
II 
I v 1/J 
VJ I. v 
/j w 
IRT - 2.5K a./ v II 
V/ 
RT =1 M-'1.-
-5-4 -3 -2 -1 0 1 2 3 4 5 
Input Voltage (m V) 
9 
NO. REV. NO. 
Aerospace 
Systems Division 
Reliability Overvoltage Tests of Fairchild 
Integrated Operational Amplifier Circuits 
ATM 801 
PAGE 6 OF 
DATE 10/10/68 
Interpretation of the Common Mode Input Offset Voltage display 
is straight forward. The Input Offset Voltage can be read directly from 
9 
the Rin = SO..n.. display for every input voltage value. This display also 
demonstrates the Input Offset Current for all input voltage values. The 
voltage difference between the Rin = 50.Jl..and Rin = 10K or 2K traces divided 
by the 10K (fA709) or 2K (j4A702) resistance values results in this current. 
For example, from the displays shown here: 
fA709 Input Offset Current@ (Vin = 0 Volts) = 
fA702 Input Offset Current@ (Vin = 0 Volts) = 
o. 2s x 1o-3v 
10K..n.. 
0.75x1o- 3v 
2K...n.. 
- 25nA 
: 37 SnA 
The same calculation can be made for every input voltage condition. 
The Transfer Function Characteristic yields various information. 
The Output Voltage Swing and Linearity can be observed directly from the 
display. The Open Loop Voltage Gain can be obtained by calculating the 
slope of the characteristics. 
Gain -
dVout 
dVin 
The over -voltage condition was applied to the devices while they were in 
the Transfer Function Test Circuit. Conditions applied were those shown 
in Figure 1 or Figure 3 except for the V+ and V- voltage levels. 
The electrical tests performed as end-point tests consisted of 
the conditions shown in Figures 1, 2, 3 and 4. 
No variation in Open Loop Voltage Gain or Input Offset Voltage 
was shown in either device type. The only noticeable variation observed 
in the investigation was a slight change in the input offset current in the 
p.A702 product which cannot be considered critical since in all cases, it 
never exceed SOnA. The Fairchild specification allows a maximum change 
of SOOnA. No variation was experienced in the fiA-709 devices. 
NO. REV. NO. 
Reliability Overvoltage Tests of Fairchild 
Integrated Operational Amplifier Circuits 
ATM 801 
PAGE 7 OF 
DATE 10/10/68 
9 
The over-voltage condition experienced in the Flight 2 system 
applied stresses to the JAA702 devices beyond the published maximum 
voltage c~ndit~ons by a gr.eater margi.n than it did the rA709 devices. Al-
though Fauch1ld has pubhshed a max1mum voltage value of 21 Vdc between 
the V + and V- terminals for the JA_A702, it is obvious that this is a con-
servative continuous operating rating which this investigation has demon-
strated can be exceeded to at least the voltage values and time durations 
applied here without degrading the device performance. The published 
maximum rating for the pA709 is V s = .±_18Vdc. The V+ • +19. 5Vdc and 
V- = -20. OVdc over-voltage condition experienced in Flight 2 is only 
slightly greater than this continuous operation rating and would not be ex-
pected to be, and indeed was not, harmful to the device as demonstrated 
in this investigation. 
4. 0 Analysis of Results 
The fact that no change was observed in the Transfer Function or 
the Common Mode Input Offset Voltage indicates that no degradation occur-
red during the over-voltage condition. Being very critical and considering 
the slight change observed in the Input Offset Current values in the r_A702 
product, the SOnA maximum change is well below the SOOnA value allowed 
by Fairchild and that a current of this amplitude is well within the realm 
of normal leakage current values in integrated circuit products. It was 
noted that this current change reversed in some instances which would 
substantiate the consideration that this is normal leakage current as op-
posed to current caused by degradation due to power. Current due to 
power damage would not be reversible. Finally, no Input Offset Current 
change was observed after exposure to the exact over -voltage conditions 
experienced by the Flight 2 equipments. 
The conclusion reached by the results of this investigation is that 
no degradation would occur due to an over-voltage condition as experienced 
by the Flight 2 equipments for the duration of one minute or even eight 
minutes. In fact, no degradation would occur due to slight higher over-
voltage conditions for at least a duration of four minutes. 
NO. REV. NO. 
: ; . ~ 
+-5V 
Triangle 
Oscil. 
Horiz. 
Reliability Overvoltage Tests of Fairchild 
Integrated Operational Amplifier Circuits 
SK 
2K 
ATM 801 
PAGE 8 OF 
DATE 10/10/68 
11 Oscil. 
>---e~-------.- Vert. 
FIGURE 1 - fA102 Common Mode Input Offset Voltage Circuit 
+SV 
Triangle 
Os:cil. 
Horiz. 
lOOK 
SOK 
FIGURE 2 - ~70~ Transfer Function Circuit 
4 
5 
lOOK 
Vt 
~1_1 _ _.,_~,_....,.. Oscil. 
6V 
Z'ener -::-
Vert. 
9 
===-Division 
+8V 
Triangle 
Reliability Overvoltage Tests of Fairchild 
Integrated Operational Amplifier Circuits 
5K 
10K V+ 
FIGURE 3 - fA709 Common Mode Input Offset Voltage Circuit 
+5V 
Triangle 
Oscil. 
Horiz. 
-p 
SK 
2M 2 
3 
IIOOpf lOp£ 
FIGURE 4 - jAA-709 Transfer Function Circuit 
2M 
V-
NO. REV. NO. 
ATM 801 
PAGE 9 OF 9 
DATE 10/10/68 
Oscil. 
Vert. 


Reliability overvoltage tests of Fairchild integrated operational amplifier circuits

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Reliability overvoltage tests of Fairchild integrated operational amplifier circuits

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