Microchannel plates (MCP) are the basis for many spatially-resolved
single-particle detectors such as ICCD or I-sCMOS cameras employing image
intensifiers (II), MCPs with delay-line anodes for the detection of cold gas
particles or Cherenkov radiation detectors. However, the spatial
characterization provided by an MCP is severely limited by cross-talk between
its microchannels, rendering MCP and II ill-suited for autocorrelation
measurements. Here we present a cross-talk subtraction method experimentally
exemplified for an I-sCMOS based measurement of pseudo-thermal light
second-order intensity autocorrelation function at the single- photon level.
The method merely requires a dark counts measurement for calibration. A
reference cross- correlation measurement certifies the cross-talk subtraction.
While remaining universal for MCP applications, the presented cross-talk
subtraction in particular simplifies quantum optical setups. With the
possibility of autocorrelation measurement the signal needs no longer to be
divided into two camera regions for a cross- correlation measurement, reducing
the experimental setup complexity and increasing at least twofold the
simultaneously employable camera sensor region
