We report results from the testing of 35 {\mu}m thick Ultra-Fast Silicon
Detectors (UFSD produced by Hamamatsu Photonics (HPK), Japan and the comparison
of these new results to data reported before on 50 {\mu}m thick UFSD produced
by HPK. The 35 {\mu}m thick sensors were irradiated with neutrons to fluences
of 0, 1*10^14, 1*10^15, 3*10^15, 6*10^15 neq/cm^2. The sensors were tested
pre-irradiation and post-irradiation with minimum ionizing particles (MIPs)
from a 90Sr \b{eta}-source. The leakage current, capacitance, internal gain and
the timing resolution were measured as a function of bias voltage at -20C and
-27C. The timing resolution was extracted from the time difference with a
second calibrated UFSD in coincidence, using the constant fraction method for
both. Within the fluence range measured, the advantage of the 35 {\mu}m thick
UFSD in timing accuracy, bias voltage and power can be established.Comment: 9 pages, 9 figures, HSTD11 Okinawa. arXiv admin note: text overlap
with arXiv:1707.0496