Hybrid Phototransistors
Based on Bulk Heterojunction Films of Poly(3-hexylthiophene) and Zinc
Oxide Nanoparticle
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Abstract
Hybrid phototransistors (HPTRs) were fabricated on glass
substrates using organic/inorganic hybrid bulk heterojunction films
of p-type poly(3-hexylthiophene) (P3HT) and n-type zinc oxide nanoparticles
(ZnO<sub><i>NP</i></sub>). The content of ZnO<sub><i>NP</i></sub> was varied up to 50 wt % in order to understand
the composition effect of ZnO<sub><i>NP</i></sub> on the
performance of HPTRs. The morphology and nanostructure of the P3HT:ZnO<sub><i>NP</i></sub> films was examined by employing high resolution
electron microscopes and synchrotron radiation grazing angle X-ray
diffraction system. The incident light intensity (<i>P</i><sub>IN</sub>) was varied up to 43.6 μW/cm<sup>2</sup>, whereas
three major wavelengths (525 nm, 555 nm, 605 nm) corresponded to the
optical absorption of P3HT were applied. Results showed that the present
HPTRs showed typical p-type transistor performance even though the
n-type ZnO<sub><i>NP</i></sub> content increased up to 50
wt %. The highest transistor performance was obtained at 50 wt %,
whereas the lowest performance was measured at 23 wt % because of
the immature bulk heterojunction morphology. The drain current (<i>I</i><sub>D</sub>) was proportionally increased with <i>P</i><sub>IN</sub> due to the photocurrent generation in addition
to the field-effect current. The highest apparent and corrected responsivities
(<i>R</i><sub>A</sub> = 4.7 A/W and <i>R</i><sub>C</sub> = 2.07 A/W) were achieved for the HPTR with the P3HT:ZnO<sub><i>NP</i></sub> film (50 wt % ZnO<sub><i>NP</i></sub>) at <i>P</i><sub>IN</sub> = 0.27 μW/cm<sup>2</sup> (555 nm)