Abstract

The contact resistance of metal–graphene junctions has been actively explored and exhibited inconsistencies in reported values. The interpretation of these electrical data has been based exclusively on a <i>side</i>-contact model, that is, metal slabs sitting on a pristine graphene sheet. Using <i>in</i> <i>situ</i> X-ray photoelectron spectroscopy to study the wetting of metals on as-synthesized graphene on copper foil, we show that side-contact is sometimes a misleading picture. For instance, metals like Pd and Ti readily react with graphitic carbons, resulting in Pd- and Ti-carbides. Carbide formation is associated with C–C bond breaking in graphene, leading to an <i>end</i>-contact geometry between the metals and the periphery of the remaining graphene patches. This work validates the <i>spontaneous</i> formation of the metal–graphene end-contact during the metal deposition process as a result of the metal–graphene reaction instead of a simple carbon diffusion process

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