Effect of Ozone on the Stability of Solution-Processed
Anthradithiophene-Based Organic Field-Effect Transistors
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Abstract
We
have investigated the degradation effects of ozone exposure
on organic field-effect transistors based on 2,8-difluoro-5,11-bis(triethylsilylethynyl)anthradithiophene
as the organic semiconducting channel layer, as well as on thin films
of this widely used, high-mobility, small molecule semiconductor.
Electrical <i>I</i>–<i>V</i> measurements
showed a loss of transistor characteristic behavior. We present <sup>1</sup>H Nuclear Magnetic Resonance (NMR) spectroscopy results as
well as X-ray Photoemission Spectroscopy (XPS) and Fourier Transform
Infrared (FTIR) spectroscopy measurements showing the oxidation of
the parent molecule, from which we suggest various possible reaction
paths