Effects of Oxide Contact Layer on the Preparation
and Properties of CH<sub>3</sub>NH<sub>3</sub>PbI<sub>3</sub> for
Perovskite Solar Cell Application
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Abstract
In perovskite solar cells, oxide
electron transport layers (ETL)
and their interface with the organometal trihalides are key to achieve
efficient and stable devices. In the present work we investigate ZnO
and TiO<sub>2</sub> ETLs and their influence on the preparation of
CH<sub>3</sub>NH<sub>3</sub>PbI<sub>3</sub> film by two different
techniques. In the “one-step” technique, a solution
is used for the deposition of a precursor layer which is dripped and
subsequently annealed. In the “two-step” sequential
technique, a PbI<sub>2</sub> precursor layer is converted into perovskite.
We show that, on ZnO, the annealing treatment of the “one-step”
deposited layer is optimum for a duration time of only 2 min. This
duration is much less critical for the TiO<sub>2</sub> underlayer.
Long annealing times produce the degradation of the pigment and formation
of PbI<sub>2</sub>. It is also shown that the “one-step”
technique gives better results for the sensitization of smooth oxide
underlayers whereas the “two-step” one must be utilized
for rough or structured underlayer sensitization. The best solar cell
performances were achieved by combining a low-overvoltage electrodeposited
ZnO layer, a planar architecture, and a perovskite layer prepared
by a “one-step” deposition-dripping route. A maximum
overall conversion efficiency of 15% was measured for the ZnO-based
perovskite solar cell. Cell impedance spectra have been measured over
a large applied voltage range. Their analysis, using an ad-hoc equivalent
circuit, shows that charge recombinations are reduced for the “one-step”
perovskite and that a better interface with the oxide is produced
in that case