<p>a) Optical micrograph of the active area on the electronic chip. The central patch is the P3HT-PCBM sample. b-f) Reconstructed phase-contrast high-resolution ptychography projections, with (b) showing the area corresponding to the section marked by the outlined white square in (a). c) Projection for as-cast film, showing that the deposition process has induced a certain morphology. d) Morphology after erasing the thermal history by shortly visiting the melt, showing an essentially featureless image. e),f) Images obtained after 60 s and an additional 660 s (total of 720 s), respectively, of annealing at 400 K, clearly showing that a coarser morphology develops with time. All images were collected at room temperature to reduce problems with radiation damage.</p
