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Direct measurement of the on-chip insertion loss of high finesse microring resonators in Si3N4-SiO2 technology.

Abstract

Microring resonators show the possibility for designing Very Large Scale Integrated (VLSI) photonic circuits by cascading them. In order to realize the devices, the on-chip insertion loss becomes an important parameter. The direct measurement of the on-chip insertion loss of a high finesse microring resonator will be presented. Its value (0.1 ± 0.1) dB is low, in agreement with calculations

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