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Test regions using two or more correlated product characteristics

Abstract

For inspection of manufactured parts, one can use the information of two\ud or more product characteristics that are strongly related to the characteristic\ud of interest. Under the condition that at most a given, typically very\ud small, fraction of the accepted parts does not satisfy the specication limit,\ud test regions are determined such that the number of accepted products is\ud maximized. The methods are illustrated by Monte Carlo results and a\ud numerical example from semiconductor industry

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