Polarized neutron reflection experiments were performed on a thin in-plane magnetized Co-Cr layer deposited on a quartz substrate. Data taken at a low magnetic field ( 0.1 T) clearly indicate the existence of an initial layer at the substrate side, whereas data at saturation ( 0.7 T) are consistent with a rather homogeneous magnetization

Frederikze, H.

Haan, P. de

Lodder, J.C.

Rekveldt, M.Th.

English

Fredrikze, H.

de Haan, P.

NARCIS 

Neutron Reflectometry on Co-Cr Layers

University of Twente Research Information

Journal of Magnetism and Magnetic Materials 120 (1993) 369-371 North-Holland Neutron reflectometry on Co-Cr layers H. Fredrikze a, p. de Haan b, J.C. Lodder b and M.Th. Rekveldt a a Interfacultair Reactor Instituut, TU Delft, 2629 JB Delft, The Netherlands b MESA, Universiteit Twente, 7500 AE Enschede, The Netherlands Polarized neutron reflection experiments were performed on a thin in-plane magnetized Co-Cr layer deposited on a quartz substrate. Data taken at a low magnetic field (--0.1 T) clearly indicate the existence of an initial layer at the substrate side, whereas data at saturation ( -- 0.7 T) are consistent with a rather homogeneous magnetization. 1. Introduction As thin films of Co-Cr  (100-300 nm thick) are candidate materials for perpendicular magnetic record- ing media, it is important to obtain detailed knowledge of the magnetic properties of such layers. To investi- gate the microstructure [1] and the magnetic properties [2] of Co-Cr layers several techniques have been used in the past; electron microscopy [3], magnetization measurements and magneto-optics [4], bitter colloid- SEM [5], neutron depolarization [6] and SANS [7]. Neutron depolarization experiments provided evidence that a (thickness-dependent) 'initial layer', with mag- netic properties different from those in the domains in the 'bulk' of the film, might exist on the substrate side of the film. The average magnetization of the lower 10-15 nm of the initial layer has been investigated using the magneto-optic Kerr effect. 2. Neutron reflectometry Neutron reflectometry is a technique for studying the nuclear and magnetic structure perpendicular to a flat surface or interface [8,9]. An extremely well colli- mated neutron beam impinges on a flat sample at grazing incidence and the intensity of specularly re- flected neutrons is measured as a function of q0, the component of the incoming wavevector perpendicular to the surface, which is determined by the grazing angle 0 and the neutron wavelength A: / 2~r q0 = --~-sin 0. (1) In a time-of-flight reflectometer variation of q0 is achieved through the wavelength of a neutron, deter- Correspondence to: H. Fredrikze, Interfacuitair Reactor Insti- tuut, TU Delft, 2629 JB Delft, The Netherlands. Tel.: + 31-15 784701; telefax: +31-15 786422; e-mail: HENKF@IRIVAX. TUDELFT.NL. mined from the velocity v which follows from the time it takes a neutron to travel the distance from a chop- per, where it enters the instrument, to the detector A = h / m v ,  (2) where h is Planck's constant and m is the mass of the neutron. The angle of incidence 0 is of the order of 1 °. Resolution requirements lead to allowed divergencies of the order of 0.1 mrad. This makes, together with the relatively low neutron fluxes available, a neutron re- flectometer a large instrument. Also the size of the samples should be large, of the order of a few cm 2. It is an essential requirement that the sample is very flat. The (q0-dependent) specularly reflected neutron in- tensity is proportional to the square of the modulus of the reflection amplitude of the neutron wavefunction perpendicular to the surface, which satisfies the Schr6dinger equation a~q,(z) Oz T -  + (q2 o - F ( z ) ) ~ b ( z )  = O. (3) The scattering length density F ± ( z )  = 4 a r ( n ( z ) ( b n ( z  ) +_ C l z ( z ) ) )  (4) depends on the (in-plane averaged) atomic number density n(z) ,  the nuclear scattering length bn(z) and the average in-plane magnetic moment /z(z) of the atoms as a function of the depth z, the value of C is 2.645 fm//z a. The + or - sign in F ( z )  represents the neutron spin parallel or anti-parallel to the in-plane magnetic moment. The nuclear scattering length of the elements and isotopes varies more or less 'randomly' over the periodic system, so that the contrast in F ( z )  can be varied by isotopic substitution. Obviously the magnetic term in F ( z )  can be exploited to investigate the magnetic structure as a function of depth in the film. The relatively weak interaction of a thermal neu- tron and an atom results in a large 'penetration depth' 0304-8853/93/$06.00 © 1993 - Elsevier Science Publishers B.V. All rights reserved 370 H. Fredrikze et al. / Neutron reflectometry on Co-Cr layers of the neutron in the surface. In contrast to X-rays, absorption (taken into account by a complex compo- nent in the scattering length b,) is for most elements negligible. The sensitivity for the magnetic state makes neutron reflectometry a unique method for investigat- ing non-homogeneous magnetic structures in (multi) layer systems and thin films. 3. Data analysis The measured reflectivities cannot be inverted di- rectly into a scattering length density profile F(z ) .  Instead, the reflectivity for a parametrized function F ( z )  is calculated according to eq. (3) as a function of q0. The parameters that describe F ( z )  are determined from a least-squares fitting procedure of the calculated reflectivity, convoluted with the experimental resolu- tion function, to the data. Standard optical matrix methods [10] can be used, since eq. (3) is completely equivalent to a description of the neutron beam in terms of a depth-dependent neutron index of refrac- tion N(z) = (I r(z) ]1/2 - k° 2 ] , (5) where k 0 represents the wavenumber of the neutron (k 0 = 2~r/A). The weak interaction of thermal neu- trons and atoms yields values of N ( z )  that deviate less than 10 -4 from 1. For most elements the nuclear scattering length b n is positive, thus for most materials external total reflection can be observed. Simultaneous analysis of two reflectivities measured on the same sample, with the spin parallel and anti- parallel to the magnetization, yields separate informa- tion on the nuclear and the magnetic structure perpen- dicular to the surface. 4. Experiments on C o - C r  layers The present experiment on an in-plane magnetized layer of Co81Cr19, rf sputtered onto a polished quartz substrate [2], was performed on the time-of-flight neu- tron reflectometer 'CRISP' of ISIS at the Rutherford- Appleton Laboratory. Magnetic fields between 0.01 and 0.7 T were applied. The results of the analysis of the data taken at the higher applied field were: film thickness 145 nm, aver- age nuclear scattering length density 0.0028 nm -2, average magnetic scattering length density 0.0016 rim-2 or average magnetic moment per atom 0.6/~ a. These figures are in good agreement with the expected val- ues, 0.0030 nm -2 for the nuclear and 0.0015 nm -2 for the magnetic scattering length densities, calculated ac- cording to bulk density and the assumption of a mag- netic moment of 0.5/~ B per atom. The analysis of the data at a lower applied field (0.1 T) indicates clearly an initial magnetic layer (i.e. an enhanced magnetic scattering length density) at the substrate side. Although it proved to be essential to take into account an 'initial magnetic layer' of the order of 15 nm thick to obtain a satisfactory fit to the neutron reflection data, the accuracy of the present data is not sufficient to quote definitively a thickness or precise shape for this layer. Note that the thickness of the initial layer observed by Bernards et al. [11] on 400-600 nm thick Co-Cr layers is of the order of the total thickness of the sample used in the present exper- iment. 1o log R -t 1 e I 301 i J, i . Is m a g n e t i c  5nO 1 0 -5 i I r I i 0.05 0.10 0.15 0.20 qo [nm -I] 1 a I I l I 30 , , , 2 O  , , , n i 0 - 5 0  loo  15 -5 I I I I i 0.05 0.10 0.15 0.20 qo [rim -I] Fig. 1. Observed specular reflectivities of Co-Cr film on glass together with model fits (a) at low magnetic field (0.1 T), and (b) at saturation magnetic field (0.7 T). The data for the neutron spin anti-parallel to the magnetization have been divided by a factor 10. In the fits nuclear and magnetic scattering length densities have been used, as shown in the inserts. tt. Fredrikze et al. / Neutron reflectometry on Co-Cr  layers 371 Unfortunately until now the data taken at 0.01 T could be fitted only using spurious scattering length density profiles. In fig. 1 measured reflectivities, for parallel and anti-parallel spins, together with fitted curves are shown. The average magnetic scattering length density at the low field (0.1 T) is 0.8 of the value at saturation. This high value might indicate a low perpendicular anisotropy field of the order of 0.1 T. This assumption was confirmed qualitatively by VSM measurements on the same sample. Future neutron reflection experi- ments will be carried out to study the field dependence of the 'initial magnetic layer' at fields below 0.1 T. The authors acknowledge the financial support of CAMST (Community Action on Magnetic Storage Technology) and NWO (Nederlandse Organisatie voor Wetenschappelijk Onderzoek). References [2] J.C. Lodder and T. Wielinga, IEEE Trans. Magn. MAG- 20 (1984) 57. [3] K. Ouehi and S. Iwasaki, IEEE Trans. Magn. MAG-18 (1982) 1120. [4] J.C. Lodder, D. Wind, Th.A.J. Popma and A. Hubert, IEEE Trans. Magn. MAG-23 (1987) 2055. [5] J. Simsova, R. Gempede, J. Kaezer and J.C. Lodder, IEEE Trans. Magn. MAG-26 (1990) 30. [6] W.H. Kraan, M.Th. Rekveidt, K. Hemmes and J.C. Lod- der, IEEE Trans. Magn. MAG-23 (1987) 65. [7] M.Th. Rekveldt, C.M.E. Zeyen, J.C. Lodder and W.H. Kraan, J. Magn. Magn. Mater. 78 (1989) 110. [8] G.P. Felcher, R.O. Hilleke, R.K. Crawford, J. Haumann, R. Kleb and G. Ostrowski, Rev. Sci. Instr. 58 (1987) 609. [9] J. Penfold and R.K. Thomas, J. Phys.: Condens. Matter 2 (1990) 1369. [10] J. Lekner, The Theory of Reflection (Martinus Nijhoff, Dordrecht, 1987). [11] J.P.C. Bernards, C.P.G. Schrauwen, S.B. Luitjens, V. Zieren and R.W. de Bie, IEEE Trans. Magn. MAG-23 (1987) 125. [1] J.C. Lodder, T. Wielinga and J. Worst, Thin Solid Films 101 (1983) 61. 

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Neutron reflectometry on Co-Cr layers

Neutron reflectometry on Co-Cr layers

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