An increasing part of the overall costs of custom and semicustom integrated circuits has to be spent for test purposes, and therefore the integration of test and design seems to be a key of cost reduction. At the University of Karlsruhe a program system is currently developed supporting the design of testable circuits. The program system under work essentially solves three tasks:
1.) Selection of an economical test strategy.
2.) Implementation of necessary circuit modifications in order to enhance testability, retaining the circuit function by construction.
3.) Generation of the test program
