Low Power BIST for Scan-Shift and Capture Power

Abstract

Low-power test technology has been investigated deeply to achieve an accurate and efficient testing. Although many sophisticated methods are proposed for scan-test, there are not so many for logic BIST because of its uncontrollable randomness. However, logic BIST currently becomes vital for system debug or field test. This paper proposes a novel low power BIST technology that reduces shift-power by eliminating the specified high-frequency parts of vectors and also reduces capture power. The authors show that the proposed technology not only reduces test power but also keeps test coverage with little loss.2012 IEEE 21st Asian Test Symposium, 19-22 Nov. 2012, Niigata, Japa