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基于扫描探针显微术研究Pb(Zr;Ti)O_3铁电薄膜的电学性质
Authors
卢焕明
李勇
魏安祥
魏艳萍
Publication date
1 January 2015
Publisher
Abstract
首先利用脉冲激光沉积技术在(001)取向的SrTiO3基片上外延生长了SrRuO3底电极和PbZr0.20Ti0.80O3(PZT)薄膜,然后利用扫描探针显微镜的压电响应模式(PFM)和导电测试模式(C-AFM)表征了PbZr0.20Ti0.80O3/SrRuO3/SrTiO3异质结薄膜纳米尺度的电学性质。以镀铂探针为上电极,利用压电响应模式获得了复合薄膜纳米尺度的压电位移-电压蝶形曲线和压电相位-电压滞后曲线,表明样品具有良好的铁电性。薄膜纳米尺度下的I-V测试结果表明经+10V电压极化后的样品,其I-V曲线在矫顽场附近出现峰值,与宏观I-V测试结果类似。导电原子力和压电力测试结果证明C-AFM可以检测到PZT薄膜样品的瞬时极化反转电流并进行成像
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Last time updated on 22/01/2018