Depth-resolved ultra-violet spectroscopic photo current-voltage measurements for the analysis of AlGaN/GaN high electron mobility transistor epilayer deposited on Si

Authors
Publication date
16 January 2017
Publisher

Abstract

Abstract is not available.

    Similar works

    Full text

    thumbnail-image

    Available Versions

    Repository of University of Nova Gorica

    redirect
    oaioai:repozitorij.ung.si:IzpisGr...
    Last time updated on 21/12/2017