Phase-diverse coherent diffraction imaging provides a route to high sensitivity and resolution with low radiation dose. To take full advantage of this, the characteristics and tolerable limits of measurement noise for high quality images must be understood. In this work we show the artefacts that manifest in images recovered from simulated data with noise of various characteristics in the illumination and diffraction pattern. We explore the limits at which images of acceptable quality can be obtained and suggest qualitative guidelines that would allow for faster data acquisition and minimize radiation dose
