The IEEE 1149.1 standard test access port and boundary-scan architecture [1] was approved in1990 in response to the need for coping with shrinking sizes due to advanced packaging andmounting technologies, and also with the increasing complexity of modern microelectronicdevices. Boundary-scan test (BST) was quickly adopted by all industry sectors, including testequipment manufacturers, CAD tool providers, and microcircuit designers and manufacturers.Many tools and integrated solutions are now available on the market to support BST, but theyare essentially dedicated to production test environments. The work presented in this documentaddresses the development of a network of low-cost distributed BST controllers, based onmicro-webserver boards
