Comparing interface dosimetry with conventional methods and TSEE.

Abstract

Dose enhancement factors at plane TEM/metal interfaces have experimentally been determined for photon beams. The measurements were performed ionometrically and, for comparison, with solid state dosemeters. Emphasis was given to TSEE allowing for transition-zone dosimetry on a near-microscopic scale. Dose enhancement of as much as 58 directs interest towards radiological and technical applications