'Institute of Electrical and Electronics Engineers (IEEE)'
Doi
Abstract
Abstract—An electrooptical measurement system for the dc
characterization of visible detectors for CMOS-compatible vision
chips is presented, which can help designers to characterize these
detectors. The measurement system has been designed to be
versatile, fast, and easily expandable and used. Two different
setups for the measurement of the spectral response and the
optical dynamic range of the detectors are described in detail.
Measurements of the spectral response are done with a fully
computer-controlled setup, avoiding tedious and inaccurate measurements.
A description of the different detectors available in
a CMOS process is also given, together with the parameters
affecting their response and a set of test structures which can
be useful for the characterization of the detectors
