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research
Effect of Radiation Exposure on the Retention of Commercial NAND Flash Memory
Authors
M. A. Carts
D. Chen
+4 more
M. Friendlich
K. A. LaBel
Timothy R. Oldham
C. M. Seidleck
Publication date
25 July 2011
Publisher
Abstract
We have compared the data retention of irradiated commercial NAND flash memories with that of unirradiated controls. Under some circumstanc es, radiation exposure has a significant effect on the retention of f lash memories
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oai:casi.ntrs.nasa.gov:2011001...
Last time updated on 31/05/2013