An improved AOTF-based imaging spectrometer that offers several advantages over prior art AOTF imaging spectrometers is presented. The ability to electronically set the bandpass wavelength provides observational flexibility. Various improvements in optical architecture provide simplified magnification variability, improved image resolution and light throughput efficiency and reduced sensitivity to ambient light. Two embodiments of the invention are: (1) operation in the visible/near-infrared domain of wavelength range 0.48 to 0.76 microns; and (2) infrared configuration which operates in the wavelength range of 1.2 to 2.5 microns
