Present methods of correcting airborne imaging spectrometer (AIS) data for instrumental and atmospheric effects include the flat- or curved-field correction and a deviation-from-the-average adjustment performed on a line-by-line basis throughout the image. Both methods eliminate the atmospheric absorptions, but remove the possibility of studying the atmosphere for its own sake, or of using the atmospheric information present as a possible basis for theoretical modeling. The method discussed here relies on use of ground-based measurements of the surface spectral reflectance in comparison with scanner data to fix in a least-squares sense parameters in a simplified model of the atmosphere on a wavelength-by-wavelength basis. The model parameters (for optically thin conditions) are interpretable in terms of optical depth and scattering phase function, and thus, in principle, provide an approximate description of the atmosphere as a homogeneous body intervening between the sensor and the ground
