Etched-disk filter was developed with fluid passageways in configuration which allows relatively unrestricted flow of fluid and has stagnation areas for collection of impurities. In addition, filter housing without center post was developed to improve flow characteristics

Hagler, R., Jr.

Toth, L. R.

English

NASA Technical Reports Server

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assage 
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Typical
Etched-Disk
Filter
Element 
Typical
Stagnatiol
Area
ical 
nation 
Typical
Etched-Disk
Filter
Element 
nner 
nement 
Tabs
Typical Etched 
(iiter	 P h. 1A
Section A—A 
Jai1uary 1975	 B74-10277 
NASA TECH BRIEF 
NASA Pasadena Office
	
£ 
NASA Tech Briefs announce new technology derived from the U.S. space program. They are issued to encourage 
commercial application. Tech Briefs are available on a subscription basis from the National Technical Information 
Service, Springfield, Virginia 22151. Requests for individual copies or questions relating to the Tech Brief program may 
be directed to the Technology Utilization Office, NASA, Code KT, Washington, D.C. 20546. 
Full-Flow Fluid Filter 
S
The problem: 
A full-flow filter with a minimal pressure drop is 
needed for use with corrosive media or in applications 
where minimum effect upon the media is desired. 
The solution: 
An etched-disk filter was developed with fluid 
passageways in a configuration which allows a 
relatively unrestricted flow of fluid and has stagnation 
areas for the collection of impurities. In addition, a 
filter housing without a center post was developed to 
improve the flow characteristics.
How it's done: 
The full-flow etched-disk filter produces a zero 
reversal of flow and a minimal pressure drop. A 
permanently-sealed (welded) filter housing without a 
center post has improved flow characteristics. Figure 
1 shows an etched-disk filter element consisting es-
sentially of a relatively-thin metal disk with shallow, 
radially-disposed, etched, fluid channels, incorpora-
ting stagnation areas located away from the main 
fluid flow streams. Fluid may flow in either direction. 
The disk has inner alinement tabs, which insure 
.
Figure 1. Etched-Disk Filter Elements
(continued overleaf) 
This document was prepared under the sponsorship of the National 	 Government assumes any liability resulting from the use of the 
Aeronautics and Space Administration. Neither the United States 	 information contained in this document, or warrants that such use 
Government nor any person acting on behalf of the United States 	 will be free from privately owned rights.
https://ntrs.nasa.gov/search.jsp?R=19740000277 2020-03-17T14:19:34+00:00Z
Etched-Disk 
Filter Element 
Typical Filter 
o
Housing Rib 
Section B—B
End Cap
luid F luio tput Fluid 
Input 
Typical Typical 
Raised Splitter 
Splitter Plate
luidFl id 
Fluid Passage 
Guide
Section A—A
B 
Etched-Disk A Filter Elements 
Splitter / 
Plate N.
Splitter Plate Filter Housing
F 
Etched-Disk 
A	 B -14 Filter Elements 
Figure 2. Etched-Disk Filter Assembly 
proper front-to-back orientation, and outer alinement 
tabs, which serve to hold the disks in alinement within 
a housing. The sectional view in this figure shows how 
the disks are oriented, front-to-back, so that the 
unetched surfaces are adjacent to the alined, etched 
channels. 
Figure 2 shows the assembled filter. The filter 
housing can be cut from extruded or broached tubing 
stock. Its length is determined by the desired flow rate 
and contamination capacity. An end cap is first weld-
ed, as shown, into one end of the prepared tubing. 
After this weld is leak tested, a stack of prealined 
filter elements is inserted into the housing, followed 
by a splitter plate and a second end cap. The second 
end cap is welded into place, and the assembled filter 
is given 'a final leak test with high-pressure nitrogen. 
The heavy arrows in Figures 1 and 2 show the fluid 
flow in one direction. The splitter plate serves to direct 
the fluid flow into the fluid passages of the housing, 
from which it passes through the filter elements.
Note: 
Requests for further information may be directed 
to:
Technology Utilization Officer 
NASA Pasadena Office 
4800 Oak Grove Drive 
Pasadena, California 91103 
Reference; TSP74-10277 
Patent status: 
Title to this invention, covered by U.S. Patent No. 
3,827,568, has been waived under the provisions of 
the National Aeronautics and Space Act [42 U.S.C. 
2457(0], to the California Institute of Technology, 
Pasadena, California 91125. 
Source: Louis R. Toth and

Ray Hagler, Jr. of 
Caltech/JPL
under contract to

NASA Pasadena Office 
(NPO-13118)
1^1 
Categories: 02 (Electronics Systems) 
04, (Materials) 
06 (Mechanics) 
B74-10277
	 08 (Fabrication Technology) 


Full-flow fluid filter

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