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research
Study of in-situ degradation of thermal control surfaces
Authors
J. E. Gilligan
G. A. Zerlaut
Publication date
1 July 1972
Publisher
Abstract
Experimental technique used in study of damage mechanism to semiconductor pigments exposed to ultraviolet radiation can be adapted for investigations of surface chemistry and may be used analytically to determine contamination
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oai:casi.ntrs.nasa.gov:1972000...
Last time updated on 31/05/2013