A dual purpose optical instrument is described capable of simultaneously acting as a spectrometer and diffractometer to respectively perform elemental and structural analysis of an unknown sample. The diffractometer portion of the instrument employs a modified form of Seeman-Bohlin focusing which involves providing a line source of X-rays, a sample, and a detector, all on the same focal circle. The spectrometer portion of the instrument employs a fixedly mounted X-ray energy detector mounted outside of the plane of the focal circle
