Analysis is guideline in examining component materials, analytically determining physical properties and chemical compositions, and developing control data necessary for ascertaining effects of environments and their influence on deterioration and degradation mechanisms

Eckstein, A. S.

English

NASA Technical Reports Server

June 1971	 Brief 71-10195 
NASA TECH BRIEF 
Marshall Space Flight Center 
NASA Tech Briefs announce new technology derived from the U.S. space program. They are issued to encourage 
commercial application. Tech Briefs are available on a subscription basis from the National Technical Information 
Service, Springfield, Virginia 22151. Requests for individual copies or questions relating to the. Tech Brief program may 
be directed to the Technology Utilization Office, NASA, Code KT, Washington, D.C. 20546. 
Teardown Analysis for Detecting Shelf-Life Degradation 
A teardown analysis technique may be applied as 
a guideline in establishing methods of predicting 
the shelf life of many consumer items such as dry 
cells, paints, ammunition, cosmetics, drugs and 
fertilizers. Since the analysis technique is used on 
devices that are basically chemical systems, some 
of its principles may be used to investigate the 
physical and chemical properties of the constituent 
materials of the consumer items. The use of tear-
down analysis as a major verification test method 
• departs from the traditional failure analysis investiga-
tions and is concerned with the disassembly and 
dissection of the component, inspection by various 
methods, and analytical testing. 
The procedures and specifications developed for 
the implementation of teardown analyses are avail-
able as guidelines in examining component materials, 
analytically determining the physical properties and 
chemical compositions, and developing the control
data necessary for ascertaining the effects of en-
vironments and their influence on deterioration 
and degradation mechanisms. 
Note: 
Requests for further information may be directed 
to:
Technology Utilization Officer 
Code A&TS-TU 
Marshall Space Flight Center 
Huntsville, Alabama 35812 
Reference: TSP71-10195 
Patent status: 
No patent action is contemplated by NASA. 
Source: A. S. Eckstein of

North American Rockwell Corp.

under contract to

Marshall Space Flight Center

(M F S-240 17) 
Category 04 
This document was prepared under the sponsorship of the National
	 Government assumes any liability resulting from the use of the 
Aeronautics and Space Administration. Neither the United States
	 information contained in this document, or warrants that such use 
Government nor any person acting on behalf of the United States
	 will be free fràm privately owned rights.
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Teardown analysis for detecting shelf-life degradation

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