Series of electron micrographs at successively lower magnifications can localize the substrate area sufficiently for a particle to be picked up by the beam of the electron microprobe. This approach could be modified to apply to fractographic studies, particularly of oxidation products stripped from fractures

Miller, E. L.

Phillips, A.

English

NASA Technical Reports Server

September 1969	 Brief 69-10465 
NASA TECH BRIEF
	 & 
NASA Tech Briefs are issued to summarize specific innovations derived from the U.S. space program, 
to encourage their commercial application. Copies are available to the public at 15 cents each 
from the Clearinghouse for Federal Scientific and Technical Information, Springfield, Virginia 22151. 
Technique for Pinpointing Submicron Particles 
in the Electron Microprobe 
This technique allows an electron microprobe 
analysis of a particular particle seen in the electron 
microscope. Use of the two instruments supported 
by photography facilitates the analysis. This approach 
could be modified to apply to fractographic studies, 
particularly of oxidation products stripped from frac-
tures. 
The light microscope of commercial electron micro-
probe X-ray analyzers does not magnify enough to 
see a submicron particle observed in the electron 
microscope. 
A series of electron micrographs at successively 
lower magnifications can localize the substrate area 
sufficiently for the particle to be picked up by the 
beam of the electron microprobe. The low magnifica-
tion electron micrograph shows the particle in rela-
tion to surrounding particles, configuration of the 
supporting screen, and other distinctive characteris-
tics of the assembly on which the particle is supported. 
When this assembly is placed in the microprobe, the 
reference points allow rapid pinpointing of the area 
in which the particle lies and of the particle itself in 
the beam.
Advantage is taken of the low magnification cap-
ability of the electron microscope to match the micro-
probe magnification best suited for scanning. 
Notes: 
1. The source of the particles investigated might be 
either terrestrial or extraterrestrial. Cosmic dust 
and micrometeorites may be collected and ana-
lyzed. 
2. No further documentation is available. Inquiries 
may be directed to: 
Technology Utilization Officer 
Headquarters 
National Aeronautics 
and Space Administration 
Washington, D.C. 20546 
Reference: B69-10465 
Patent status: 
No patent action is contemplated by NASA. 
Source: E. L. Miller and A. Phillips of 
McDonnell-Douglas 
under contract to 
NASA Headquarters 
(HQN- 10043) 
Category 01 
..
This document was prepared under the sponsorship of the National 
Aeronautics and Space Administration. Neither the United States 
Government nor any person acting on behalf of the United States
Government assumes any liability resulting from the use of the 
information contained in this document, or warrants that such use 
will be free from privately owned rights.
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Technique for pinpointing submicron particles in the electron microprobe

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