Semiautomatic machine inspects microfilm for deficiencies. Advantages of microfilm inspector are uniformity of inspection method, increased speed of inspection, and improved quality through elimination of scratches and finger marks

Klein, E. L.

English

NASA Technical Reports Server

August 1969	 Brief 69-10301 
NASA TECH BRIEF 
NASA Teèh Briefs are issued to summarize specific innovations derived from the U.S. space program, 
to encourage their commercial application. Copies are available to the public at 15 cents each 
from the Clearinghouse for Federal Scientific and Technical Information, Springfield, Virginia 22151. 
-	 ..	 iI_TiTiTTT_ 
Semiautomatic Inspection of Microfilm Records
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PIORO MEASURING CIRCUIT PNOTO 
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Fig. 1. MARK 1 Schematics of Photocell Circuit (A) and	 - 
Density-Measuring Circuit (B). and Logic Diagram (C) 
The problem: 
Microfilm in a 35mm format is the industry stand-
ard for recording engineering data and other docu-
mentation for long-term storage and retrieval. Mi-
crofilm records used by the government are con-
trolled by Specification MIL-STD-108. This specifi-
cation prescribes image size and position tolerances, 
resolution requirements, and density restrictions. 
Heretofore, microfilm inspection has been done 
manually, using an individual microscope, a densi-
tometer, a light box, and hand-cranked reels. This 
method is not only time-consuming but it is some-
times of questionable quality since subjective judg-
ment of the inspection personnel is a major factor. 
The solution: 
Inasmuch as deficiencies in microfilm quality are 
undetected by this nonuniformity of inspection ap-
paratus it follows that these deficiencies can be al-
leviated by providing a semiautomatic-type inspection 
machine for this purpose. Accordingly, two working 
models were designed and constructed by the support 
contractor to the MSFC Management Services Office. 
Improvements in reliability and ease of operation 
(continued overleaf) 
This document was prepared under the sponsorship of the National 	 Government assumes any liability resulting from the use of the 
Aeronautics and Space Administration. Neither the United States	 information contained in this document, or warrants that such use 
Government nor any person acting on behalf of the United States	 will be free from privately owned rights. 
https://ntrs.nasa.gov/search.jsp?R=19690000300 2020-03-16T18:11:03+00:00Z
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Fig. 2.
	 Outlines of MARK II; Dimensions are 
in inches. 
were made in	 the second	 prototype	 identified	 as 3.	 Improved quality through elimination of scratches, 
MARK. II. finger marks, etc. 
How it's done: Note:
 
The microfilm inspector utilizes motor-driven film Documentation is available from: Clearinghouse for Federal Scientific 
reels with a means for precisely positioning the ml-
and Technical Information 
croflim image for inspection. 	 Film density is meas- Springfield, Virginia 22151 
ured by means of a photoelectric cell and solid-state Price $3.00 
electronic	 circuit.	 Over	 and	 under	 tolerances	 are Reference: TSP69-10301 preset according to specification. As the film is in-
spected, go-no-go indicator lights advise the operator Patent status: 
of the film status.	 In addition to the lights, a densi-
tometer	 provides	 specific	 values	 for	 film	 density. This invention is owned by NASA, and a patent 
These are recorded to back up the film-inspection application	 has	 been	 filed.	 Royalty-free,	 nonex-
report. clusive licenses for its commercial use will be granted 
Resolution of the photographic image on the film by NASA.	 inquiries concerning license rights should 
is determined by a microscope which is an integral be made to NASA, Code GP, Washington, D.C. 
part of the machine.	 Image size and position are 20546 
also determined by a built-in optical device. .	 .	 .	 Source: E. L. Klein of 
Principal	 advantages	 of the . microfilm	 inspector RCA Service Company 
are:	 .	 . under contract to 
1.	 Uniformity of inspection method. . .	 Marshall Space Flight Center . 
2.	 Increased speed of inspection.	 . . .	 .	 (MFS-20240)
Brief 69-10301
	 Category. 02 


Semiautomatic inspection of microfilm records

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