Specimen holder for X ray diffraction analysis presents the specimen to the incident X rays in a curvature. This permits the use of an X ray beam having a larger divergence angle, the beam intensity is increased, and the statistical accuracy of analysis is improved

Mack, M.

English

NASA Technical Reports Server

February 1966	 Brief 66-10075 
L	 NASA TECH BRIEF	
J.4I 
NASA Tech Briefs are issued to summarize specific innovations derived from the U. S. space 
program and to encourage their commercial application. Copies are available to the public from 
the Clearinghouse for Federal Scientific and Technical Information, Springfield, Virginia 22151. 
Specimen Holder Design Improves Accuracy of X-Ray Powder Analysis 
Specimen 
Holder 
- — --
Detector	 --. 
Optics 
Optics	 Target 
.
	
PowdereBe,r,ylli um
 
SPECIMEN HOLDER DETAILS
II 
II
	
X-Ray 
II 
II 
II 
II 
'I 
The problem: 
In X-ray diffraction analysis, a specimen supported 
in the path of X-rays reflects X-rays at angles de-
termined by the spacing between planes of a crystal 
and the interplanar spacings are used for identifica-
tion of specimen composition. A flat specimen sur-
face causes an asymmetrical broadening of the line 
profile and a shift of its peak and centroid. 
The, solution: 
A holder designed to present the specimen to the 
incident X-rays in a curvature. This permits the use of 
an X-ray beam having a larger divergence angle, the 
intensity of the beam is increased, and the statistical
accuracy of analysis is improved approximately pro-
portional to the square root of the intensity. In this 
way, time for an accurate analysis measurement is 
appreciably decreased. 
How it's done: 
The specimen holder is a trough with inwardly 
curved bottom surface. The sides are flat and a 
curved portion, machined to the desired configura-
tion, forms an open bottom to which a thin beryllium 
foil (0.05 mm) is cemented. The beryllium foil serves 
as the guide surface for the powdered specimen. The 
X-ray absorption and reflectance characteristics of 
beryllium foil are well known and are readily calcu-
lated within the specimen analysis.
(continued overleaf) 
This document was prepared under the sponsorship of the National 
Aeronautics and Space Administration. Neither the United States 
Government nor any person acting on behalf of the United States
Government assumes any liability resulting from the use of the 
information contained in this document, or warrants that such use 
will be free from privately owned rights.
https://ntrs.nasa.gov/search.jsp?R=19660000075 2020-03-11T17:34:23+00:00Z
Patent status: 
Title to this invention (covered by U.S. Patent No. 
3,148,275) has been waived under the provisions of 
the National Aeronautics and Space Act (42 U.S.C. 
2457 (f)) to the North American Phillips Corporation, 
Briarcliff Manor, New York, 10510. 
Source: Marian Mack of
North American Phillips Corporation
under contract to

Jet Propulsion Laboratory 
(JPL-SC- 165)
. 
Brief 66-10075	 Category 02


Specimen Holder Design Improves Accuracy of X-Ray Powder Analysis

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