Semiautomatic device with a four-terminal network tests quantities of components having biaxial leads. The four-terminal network permits the testing of components in different environments. This device is easily modified for completely automatic operation

Marshall, T. C.

English

NASA Technical Reports Server

Ledex S 
Rea 
August 1966	 Brief 66-10337 
NASA TECH BRIEF 
NASA Tech Briefs are issued to summarize specific innovations derived from the U. S. space 
program and to encourage their commercial application. Copies are available to the public from 
the Clearinghouse for Federal Scientific and Technical Information, Springfield, Virginia 22151. 
Semiautomatic Device Tests Components with Biaxial Leads 
The problem: 
To devise a semiautomatic method of testing quan-
tities of components having biaxial leads. 
The solution: 
A semiautomatic device that includes a four-
terminal network for testing components in different 
environments.
How it's done: 
The components to be tested are loaded in a slotted 
clip. A remotely operated wheel with two notches on 
the perimeter, 180 degrees apart, feeds the compo-
nents one at a time into the four clips in the load 
station. The load station consists of four spring 
loaded clips mounted on two dual-sided copper clad 
(continued overleaf) 
This document was prepared under the sponsorship of the National 
Aeronautics and Space Administration. Neither the United States 
Government nor any person acting on behalf of the United States
Government assumes any liability resulting from the use of the 
information contained in this document, or warrants that such use 
will be free from privately owned rights.
https://ntrs.nasa.gov/search.jsp?R=19660000336 2020-03-11T17:40:01+00:00Z
revolving discs. This supplies the four required termi-
nals that are open to receive the component leads with 
the disk clips in the load position. These clips close 
on the component leads when the disks are rotated 90 
degrees clockwise by the hand crank to the measuring 
station position. The component surface temperature 
is measured by the thermocouple. The tested compo-
nent is electrically connected to the outside of the 
chamber by leads from the spring loaded metal 
brushes riding on the copper-clad disks. Only two 
leads are required for bridge measurements. However, 
for measurements by the voltage-current method, two 
additional leads are required for applying power. 
After the component is tested, the crank is turned 
an additional 90 degrees clockwise to the release 
station which opens the clips. The tested component 
slides down a ramp to a storage compartment. The 
crank is turned 180 degrees counterclockwise to the 
load station position. The next component is fed 
into position by closing the switch until the ledex
switch closes. This rotates the wheel to release the 
next component into the load station. 
Notes: 
1. This device can be easily modified. for complete 
automatic operation. 
2. A related innovation is described in NASA Tech 
Brief B65-10243, August 1965. Inquiries may also 
be directed to: 
Technology Utilization Officer 
Manned Spacecraft Center 
Houston, Texas 77058 
Reference: B66-10337 
Patent status: 
No patent action is contemplated by NASA. 
Source: Thomas C. Marshall 
of North American Aviatipn, Inc. 
under contract to 
Manned Spacecraft Center 
(MSC-516) 
Brief 66-10337	 Category 05


Semiautomatic device tests components with biaxial leads

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