Experimental validation of simple electrothermal circuit models for SOI MOSFETs using direct DC-UHF measurement of drain admittance

Authors
Publication date
1 September 1995
Publisher

Abstract

Abstract is not available.

    Similar works

    Full text

    thumbnail-image

    Available Versions

    Southampton (e-Prints Soton)

    redirect
    oaioai:eprints.soton.ac.uk:253006
    Last time updated on 05/04/2012