Ion implantation of Mn combined with pulsed laser melting is employed to
obtain two representative compounds of dilute ferromagnetic semiconductors
(DFSs): Ga1-xMnxAs and In1-xMnxAs. In contrast to films deposited by the widely
used molecular beam epitaxy, neither Mn interstitials nor As antisites are
present in samples prepared by the method employed here. Under these conditions
the influence of localization on the hole-mediated ferromagnetism is examined
in two DFSs with a differing strength of p-d coupling. On the insulating side
of the transition, ferromagnetic signatures persist to higher temperatures in
In1-xMnxAs compared to Ga1-xMnxAs with the same Mn concentration x. This
substantiates theoretical suggestions that stronger p-d coupling results in an
enhanced contribution to localization, which reduces hole-mediated
ferromagnetism. Furthermore, the findings support strongly the heterogeneous
model of electronic states at the localization boundary and point to the
crucial role of weakly localized holes in mediating efficient spin-spin
interactions even on the insulator side of the metal-insulator transition.Comment: 23 pages, 10 figures, to appear at Phys. Rev. Mate