GS-MBE生长的GaP/Si的XPS研究

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Publication date
1 January 1998
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Abstract

利用X射线光电子能谱(XPS)深度剖析方法对气体源分子束外延(GS-MBE)生长的GaP/Si异质结构进行了详细的分析。其结果表

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